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材料檢定技術：
Scanning Electron Microscope (SEM)
Optical Microscope (OM)
Optical Emission Spectroscopy (OES)
Thermogravimetric Analysis (TGA)
Differential Thermal Analysis (DTA)
X-ray Diffraction (XRD)
Transmission Electron Microscope (TEM)
Atomic Force Microscope (AFM)
Fourier Transform Infrared Spectroscopy (FTIR)
UV-vis (UV visible)

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    Jinan20130830

    Tangerine John

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